A new physical model for on-chip interconnect on high lossy substrate is proposed based on complex image theory and PEEC.
针对高损耗衬底，基于复镜像理论，结合部分元等效电路法，建立了一种新的片上互连线物理模型。
A new physical model for on-chip interconnect on high lossy substrate is proposed based on complex image theory and PEEC.
针对高损耗衬底，基于复镜像理论，结合部分元等效电路法，建立了一种新的片上互连线物理模型。
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