A simple and effective method to supervise the facet reflectivity of semiconductor optical amplifier is proposed in this paper during the anti-reflectivity coating procedure.
本文介绍了一种在半导体光放大器镀膜过程中监测端面反射率的简单而有效的方法。
A simple and effective method to supervise the facet reflectivity of semiconductor optical amplifier is proposed in this paper during the anti-reflectivity coating procedure.
本文介绍了一种在半导体光放大器镀膜过程中监测端面反射率的简单而有效的方法。
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