The present invention provides a thin film transistor substrate realizing reduced interlayer short-circuit defects in a capacitor, and a display device having the thin film transistor substrate.
本发明提供了一种薄膜晶体管衬底和具有这种薄膜晶体管衬底的显示装置，这种薄膜晶体管衬底能够减小电容器中的层间短路缺陷。
By contacting with PCB, electrical testers, such as in-circuit tester, not only can test most of manufacturing defects and faults, but also can test PCB assemblers' electrical performance.
以电气接触为手段、以在线测试仪为代表的电气测试仪除了能够测试制造过程的缺陷和故障以外，还能够测试pcb的某些电气性能，因而得到了广泛的应用。
In addition, the causes and optimization scheme of defects in the original design for combustion air coefficient correction circuit have been discussed in detail, after putting the...
此外，对燃烧空气系数校正回路原设计缺陷的原因以及优化方案进行了详细讨论，优化方案投入实际应用后，取得了良好效果。
The defects in traditional drive circuit existing in availabele EL monitors are pointed out Matrix drive circuit system for EL monitor is designed using the conception of "balanced drive".
指出了传统EL显示器驱动电路存在的问题。用“平衡驱动”的概念，设计了矩阵式EL显示器驱动电路系统。
Today, the test engineer has many more options, including in-circuit testers, manufacturing defects analyzers, and several types of functional testers.
今天，测试工程师有很多选择，包括在线测试设备，制造缺陷分析设备和一些功能测试设备。
By contacting with PCB, in-circuit testing technology, not only can test most of manufacturing defects and faults, but also can test PCB assemblers' electrical performance.
以电气接触为手段，在线测试设备除了能够测试制造过程的缺陷和故障以外，还能够测试pcb的某些电气性能，因而得到了广泛应用。
By contacting with PCB, in-circuit tester, not only can test most of manufacturing defects and faults, but also can test PCB assemblers' electrical performance.
以电气接触为手段，在线测试设备除了能够测试制造过程的缺陷和故障以外，还能够测试pcb的某些电气性能，因而得到了广泛应用。
As interconnection wire spacing becomes smaller and the circuit operating frequency runs higher, the problems of crosstalk noises and spot defects become very crucial.
随著积体电路中线路之间的距离越来越小且整个电路的运算速度也越来越快，因此交感杂讯（crosstalknoises）和瑕疵点（spot defects）的问题亦日趋重要。
As interconnection wire spacing becomes smaller and the circuit operating frequency runs higher, the problems of crosstalk noises and spot defects become very crucial.
随著积体电路中线路之间的距离越来越小且整个电路的运算速度也越来越快，因此交感杂讯（crosstalknoises）和瑕疵点（spot defects）的问题亦日趋重要。
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