The invention provides a test circuit and a method for increasing the scanning coverage rate of a chip circuit.

本发明提供一种测试电路及其增加芯片电路扫描覆盖率的方法。

youdao

The invention provides a test circuit and a method for increasing the scanning coverage rate of a chip circuit.

本发明提供一种测试电路及其增加芯片电路扫描覆盖率的方法。

youdao