Using Binary Decision Diagrams, this paper proposes a test generation method for functional level digital circuits.

本文利用二叉判定图提出了对功能级数字电路的一种测试产生方法。

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Ordered binary decision diagrams(OBDDs)are a data structure for efficient representation and manipulation of Boolean functions. The size of OBDDs is very sensitive to variable ordering.

有序二叉决策图（OBDD）是一种有效表示布尔函数的数据结构，其大小依赖于所采用的变量序。

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By the B-cut sets and the probabilities of the nodes of Binary Decision Diagrams (BDD), a new quantitative analysis algorithm of coherent fault tree based on BDD is presented in this paper.

利用二元决策图(BDD)中的B—割集和节点概率，提出了基于BDD的关联故障树定量分析新算法。

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By the B-cut sets and the probabilities of the nodes of Binary Decision Diagrams (BDD), a new quantitative analysis algorithm of coherent fault tree based on BDD is presented in this paper.

利用二元决策图(BDD)中的B—割集和节点概率，提出了基于BDD的关联故障树定量分析新算法。

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