• The relation of stress time to parameter degradation is investigated under the condition of reverse bias of base-emitter junction.

    在基极-发射极反向偏置的条件下,研究了应力作用时间与器件参数的退化关系。

    youdao

  • In typical operation, the emitter-base junction is forward biased and the base-collector junction is reverse biased.

    在正常工作中,发射结正向偏置,基集电结反向偏置。

    youdao

  • In typical operation, the emitter-base junction is forward biased and the base-collector junction is reverse biased.

    在正常工作中,发射结正向偏置,基集电结反向偏置。

    youdao

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