The implementation of automatic test generation and fault diagnosis is also discussed.
还讨论了测试码自动生成和故障诊断的具体实现方法。
This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).
本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。
This paper presents an efficient sequential circuit automatic test generation algorithm. The algorithm is based on self - adapting algorithm and USES a seventeen - valued logic model.
本文提出了一种高效的时序电路测试生成算法，该算法是建立在自适应算法的基础上，并使用了十七值逻辑模型。
This paper presents an efficient sequential circuit automatic test generation algorithm. The algorithm is based on self - adapting algorithm and USES a seventeen - valued logic model.
本文提出了一种高效的时序电路测试生成算法，该算法是建立在自适应算法的基础上，并使用了十七值逻辑模型。
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