• The system can be combined with a variety of atomic force microscope.

    该系统可应用于多种相关原子力显微镜设备。

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  • An image of a circuit with 17 memristors captured by an atomic force microscope.

    原子力显微镜拍摄的17个忆阻器构成电路的图像。

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  • And the surface texture data by atomic force microscope (AFM) are obtained.

    用原子力显微镜作为测量工具,获取表面形貌数据。

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  • Methods T he cultured U251 glioma cell line was detected with atomic force microscope(AFM) .

    方法应用原子力显微镜,对U251胶质瘤细胞系进行观测。

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  • Atomic Force Microscopy (AFM) is a main instrument for nano-scale measurement and manipulation.

    原子力显微镜(afm)是进行纳米测量和操作的一种主要工具。

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  • The atomic force microscope can detail the shapes of particles as small as about 100 nanometers.

    这种原子力显微镜能够扫描象100纳米一样小的颗粒的形状。

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  • To observe linear DNA with atomic force microscope (AFM) and investigate the imaging conditions.

    用原子力显微镜(afm)观察线性DNA并探讨其成像条件。

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  • Atomic force microscope (AFM) is one of the newest imaging techniques in the field of biomedicine.

    原子力显微镜(afm)是目前最新的生物成像技术之一。

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  • Atomic force microscope was used to observe the surface topography with different ssDNA concentration.

    利用原子力显微镜观察不同浓度的DNA吸附在金膜上的表面形貌。

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  • Optical lever method is a main technique to detect the cantilever's position in atomic force microscope (AFM).

    光杠杆法是原子力显微镜(afm)悬臂定位的主要方法。

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  • Designed an automatic control system of 42m-1.8d motor, which can be widely used in the atomic force microscope.

    设计出一套能微纳米运动的42M- 1.8D电机自动控制系统,可广泛应用于大部分原子力显微镜。

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  • Changes in surface roughness after gas cluster ion bombardments have been measured by an atomic force microscope.

    用原子力显微镜测量了气体离化团束照射后表面粗糙度的变化。

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  • Working at tapping mode, atomic force microscope(AFM) piezoelectric microcantilever vibrates with large amplitude.

    在轻敲工作模式下,原子力显微镜(AFM)压电微悬臂以较大的振幅振动。

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  • Now scientists are combining the 3-D capability of MRI with the precision of a technique called atomic force microscopy.

    现在,科学家们将一种名为原子力显微技术的精度结合到MRI的三维成像能力上。

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  • Force curve measured by Atomic force Microscope needs to be converted into force-displacement curve for application.

    原子力显微镜测定的力曲线需转化为力位移曲线来应用。

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  • With the emersion of atomic force microscope, the study of single macromolecular chain at interfaces becomes possible.

    随着原子力显微镜的诞生,使高分子单链的界面研究成为可能。

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  • Professor Abdullah Atalar now researches atomic force microscopy and digital integrated circuit design at Bilkent University.

    Abdullah Atalar教授目前在比尔·肯特大学从事原子力显微镜和数字集成电路设计的研究。

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  • This paper briefs the principle and some advance of scanning tunneling microscope (STM) and atomic force microscope (AFM).

    介绍了扫描隧道显微镜(STM)和原子力显微镜(afm)的原理和目前情况。

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  • Dynamic electric force microscopy was set up on a commercial atomic force microscope (AFM) to study the polarization of single nanocrystal.

    在现有的商用原子力显微镜上实现了用动态电场力显微术来研究单个纳米颗粒的极化特性。

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  • In 1991, theoretical physicist John Sidles first proposed the idea of combining MRI with atomic force microscopy to image tiny biological structures.

    1991年,理论物理学家约翰·赛德斯首次提出了将原子力显微技术与MRI相结合用以对微小生物结构成像的想法。

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  • Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.

    原子力显微镜是运用一种微小的探针去“感受”样本表面,能得到高分辨率的影像(约5纳米的分辨率)。

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  • The usage of AFM(atomic force microscope), which is a new method of surface test, in studying the fine structure of natural pig collagen was discussed.

    简要介绍了原子力显微镜这一新型表面测试技术在猪皮胶原精细结构研究中的应用方法。

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  • This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.

    文中对原子力显微镜(afm)电场诱导硅氧化结构的部分形状特征进行了分析和讨论。

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  • The characters of surface morphology of pure aluminum matrix composites were observed by atomic force microscope (AFM) during the early stages of corrosion.

    利用原子力显微镜观察了纯铝基复合材料早期腐蚀过程中表面形貌的变化特征。

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  • The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).

    使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。

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  • The surface morphology and chemical structure of the film are characterized by Atomic Force Microscope (AFM) and Fourier Transform Infrared Spectroscope (FTIR).

    并且分别利用原子力显微镜和傅立叶变换红外光谱对薄膜进行界面形态和微观结构分析。

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  • Japanese researchers have used a high-speed atomic force microscopy (AFM) to shoot a movie of the tiny rotating enzyme that produces the chemical fuel for cells.

    日本研究者们使用了一种高速原子力显微镜(afm)拍摄一部小旋转酶给电池产生化学燃料的电影。

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  • The surface of the gold film, the microstructure of the polyurethane film and the surfaces with adsorbed proteins were imaged with an atomic force microscope (AFM).

    同时应用原子力显微镜对金膜和聚氨酯材料的超微结构与材料表面上所吸附的蛋白质进行了表征。

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  • Using an atomic force microscope and two layers of insulators (lanthanum aluminum oxide and strontium titanium oxide), Levy and his colleagues created a nanoscale transistor.

    列维和他的同事们用原子力显微镜和两片绝缘体(镧氧化铝和锶钛氧化物),研制出了一枚纳米晶体管。

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  • Using an atomic force microscope and two layers of insulators (lanthanum aluminum oxide and strontium titanium oxide), Levy and his colleagues created a nanoscale transistor.

    列维和他的同事们用原子力显微镜和两片绝缘体(镧氧化铝和锶钛氧化物),研制出了一枚纳米晶体管。

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