SRAM BIST is also combined with ARM core's boundary scan testing during system level DFT.
系统级可测性设计主要是将存储器BIST与ARM核的边界扫描测试相结合。
Before the scan starts, a small needle is inserted into your arm for the injection of the contrast medium.
在扫描开始前，可能需要在你的臂膀上扎下小针头来注射造影剂。
ARM controls data's download, storage and delivery, and FPGA to achieve the acceptance of data, cache and scan.
ARM控制数据的下载、存储和发送，FPGA实现数据的接受、缓存和扫描显示。
ARM controls data's download, storage and delivery, and FPGA to achieve the acceptance of data, cache and scan.
ARM控制数据的下载、存储和发送，FPGA实现数据的接受、缓存和扫描显示。
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