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An instrument based on area array CCD devices for measuring stresses in semiconductor materials is studied and realized.
研究和实现了采用面阵CCD器件的半导体材料应力测试仪。
youdao
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An instrument based on area array CCD devices for measuring stresses in semiconductor materials is studied and realized.
研究和实现了采用面阵CCD器件的半导体材料应力测试仪。
youdao