We have constructed a digital PID feedback control system of AFM.
设计完成了AF M的数字PID反馈控制系统。
And the surface texture data by atomic force microscope (AFM) are obtained.
用原子力显微镜作为测量工具，获取表面形貌数据。
Single molecule force spectroscopy (SMFS) is a force measurement based on AFM.
单分子力谱是基于原子力显微镜力的测量方法。
AFM is the foremost development on the image technique of the surface in near ten years.
原子力显微镜(afm)是近十几年来表面成像技术中最重要的进展之一。
This paper proposes a learning control based high-speed scanning mode for an AFM system.
本文针对原子力显微镜系统，提出了一种基于学习控制的快速扫描模式。
Three-dimension pattern of shear bands was investigated using atom force microscopy(AFM).
用原子力显微镜（AFM）研究了剪切带的三维形貌。
Methods T he cultured U251 glioma cell line was detected with atomic force microscope(AFM) .
方法应用原子力显微镜，对U251胶质瘤细胞系进行观测。
There are some new discoveries on the crystal growth mechanism based on the AFM study so far.
关于晶面结构各向异性对晶体生长影响的研究已有新的内容；
Therefore the dynamic force sensitivity and the resolution of a conventional AFM are improved.
从而提高了原子力显微镜的动态力灵敏度和分辨力。
Ultramicrotome makes nanoslices of a sample and a freshly cut surface is then measured by AFM.
超薄切片机可以制备用于原子力显微镜研究的纳米片层和新鲜表面。
Atomic Force Microscopy (AFM) is a main instrument for nano-scale measurement and manipulation.
原子力显微镜(afm)是进行纳米测量和操作的一种主要工具。
To observe linear DNA with atomic force microscope (AFM) and investigate the imaging conditions.
用原子力显微镜(afm)观察线性DNA并探讨其成像条件。
The AFM observation of martensitic surface relief effect showed to be direct, accurate and vivid.
AFM对马氏体相变形状应变特征的观测更直观、准确和真实。
Atomic force microscope (AFM) is one of the newest imaging techniques in the field of biomedicine.
原子力显微镜(afm)是目前最新的生物成像技术之一。
There are many questions to be resolved for quantitative analysis, especially in tapping mode AFM.
在这方面定量的研究还面临许多问题，尤其是对于轻敲模式。
The viscosity of flowable abrasive mixture is an important parameter in abrasive flow machining (AFM).
流体磨料的粘度是磨料流加工工艺的重要参数。
The solvent effect on the preparation of PVA film by low speed spin machine was studied by using AFM and XRD.
本文采用原子力显微镜和X射线粉末衍射仪研究了PVA溶液旋转涂膜的溶剂化效应。
Optical lever method is a main technique to detect the cantilever's position in atomic force microscope (AFM).
光杠杆法是原子力显微镜(afm)悬臂定位的主要方法。
Working at tapping mode, atomic force microscope(AFM) piezoelectric microcantilever vibrates with large amplitude.
在轻敲工作模式下，原子力显微镜（AFM）压电微悬臂以较大的振幅振动。
The AFM characterization showed that the nanoparticles produced are well dispersed with a narrow size distribution.
原子粒显微镜(afm)检测显示，由此制备的纳米颗粒很好地分布在一个狭窄的尺寸范围。
The lens body is applied on STM or AFM to realize scanning on a large samples, and the high -resolution is guaranteed.
将该镜体应用在STM和AFM上，实现了对样品的大范围扫描检测，并保证了测量的高精度。
This paper briefs the principle and some advance of scanning tunneling microscope (STM) and atomic force microscope (AFM).
介绍了扫描隧道显微镜(STM)和原子力显微镜(afm)的原理和目前情况。
In bending test, the spring constant of AFM micro cantilever is corrected through the calibration of its effective length.
在弯曲测试实验中，通过标定测试用AFM微悬臂梁的有效长度，从而修正了其弹簧常数。
This design not only can realize large range scanning of AFM, but also does not request the high load ability of the scanner.
设计方案对扫描器的负载能力要求不高，而且能使原子力显微镜实现较大范围的针尖扫描。
The theory of field-induced oxidation and the impact of bias voltage and pulse time on the nanofabrication were studied by AFM.
用原子力显微镜（AFM）研究了电场诱导氧化理论以及偏置电压和脉冲时间对加工结构尺寸的影响。
The scenario is explored in Hubbard model including electron-electron couplings mediated by antiferromagnetic(AFM) spin fluctuation .
这个方案是在赫伯德模型中研究反铁磁（AFM）自旋涨落调制的电子-电子耦合。
The usage of AFM(atomic force microscope), which is a new method of surface test, in studying the fine structure of natural pig collagen was discussed.
简要介绍了原子力显微镜这一新型表面测试技术在猪皮胶原精细结构研究中的应用方法。
AIRPLANE FLIGHT MANUAL (AFM), The legal document containing performance and operating limits, operating procedures, and takeoff and landing performance.
飞机飞行手册(afm)，包合性能极限，操作极限，操作程序，起飞和着陆性能等资料的法定文件。
Finally, we use XPS, AFM, ultraviolet, infrared and Raman to analyze the component, structure and feature of the films qualitatively and quantitatively.
最后通过XPS,AF M，紫外，红外，拉曼对薄膜的成分、结构和特性作了定性和半定量分析。
This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.
文中对原子力显微镜(afm)电场诱导硅氧化结构的部分形状特征进行了分析和讨论。
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