保证了失调误差较小，同时使算法在自适应初始阶段有较快的收敛速度。
It ensure the misadjustment is small and the algorithm has a high speed of convergence in the forepart of adaptation.
分析了正交误差和失调误差产生的原因，推导了正交误差和失调误差的表达式。
The reasons for inducing quadrature error and offset error are analyzed and the expressions of quadrature error and offset error are induced.
设计中采用了动态比较器来降低功耗，其较大的失调误差可以通过数字校正电路进行校正。
The dynamic comparator is adopted to eliminate the power dissipation, the large offset of the dynamic comparator can be eliminated by digital correction circuit.
输入失调电流是两个差动输入端的基极输入电流，当两个输入端的源阻抗不相等时，它可引起仪表放大器的失调误差。
Input offset current is the difference between the two input bias currents and this leads to offset errors in in-amps when source resistances in the two input terminals are unequal.
通过研究对数运算电路独特的运算特性，设计出一种满足消除电桥参考电压影响的电路模型，为高精度电桥类传感器设计提供了一种独特的减小失调误差影响的手段。
The property of the logarithm circuit is studied. A model is given to reducing the error of bridge, and a kind of high-precision transducer without the influence of the voltage supply is designed.
R2和R4用来降低因输入失调电流产生的误差，其原理与前文光电二极管放大器所述一致。
R2 and R4 are chosen to minimize errors due to input offset current as outlined in the section describing the photocell amplifier.
根据失调拼接光栅对压缩系统模型，推导了拼接误差引起的角色散公式。
Base on the model of grating-pair compressor, the formula of angular dispersion caused by alignment errors was derived.
利用相应的高层次模型，详细分析并仿真了电流源匹配误差和电流源输出阻抗对DAC的非线性误差nl、信号噪声失调比SNDR、无杂波动态范围SFDR的影响。
With corresponding models how the matching errors and output resistance of current source affect the NL, SNDR and SFDR of DAC is analyzed and simulated in detail.
分析了电流—电压转换原理，指出转换误差主要来源于偏置电流及失调电压。
The principle of transforming current to voltage is analyzed, and it is pointed out that the error factors mainly consist in the bias current and offset voltage of the operational amplifier.
端点精度由片内失调与增益校准来保证，此校准程序可使器件的零电平与满量程误差降至最小。
Endpoint accuracy is ensured by on-chip calibration of offset and gain. This calibration procedure minimizes the part's zero-scale and full-scale errors.
端点精度由片内失调与增益校准来保证，此校准程序可使器件的零电平与满量程误差降至最小。
Endpoint accuracy is ensured by on-chip calibration of offset and gain. This calibration procedure minimizes the part's zero-scale and full-scale errors.
应用推荐