通过理论计算和代价分析，在消耗资源不多的情况下，当微处理器发生故障时其可测试率达到了99%以上。
Through theoretical calculations and the cost analysis, with few consumption of resources, the rate can be tested to reach 99% when a fault is in its microprocessor.
通过理论计算和代价分析，在消耗资源不多的情况下，当微处理器发生故障时其可测试率达到了99%以上。
Through theoretical calculations and the cost analysis, with few consumption of resources, the rate can be tested to reach 99% when a fault is in its microprocessor.
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