本文扼要地介绍了电子元器件失效分析所采用的一些最新技术和仪器设备。
This paper briefly introduces some latest technology and equipments dealing with invalidation of electronic primary device.
本文扼要地介绍了电子元器件失效分析所采用的一些最新技术和仪器设备。
This paper briefly introduces sonic latest technology and equipments dealing with invalidation of electronic primary device.
简述了电子元器件失效分析的常用技术手段和失效元器件的失效现象、失效模式、失效机理。
This paper elucidates the usual technical means of the failure analysis of the electronic component and the failure phenomenon, failure mode and failure mechanism of failure electronic component.
本文介绍了核辐射使电子元器件失效的机制以及离子束分析技术在抗核加固研究中的若干应用。
The mechanism of radiation damage effects on electronic devices and the applications of ion beam analysis in the investigations of radiation hardening were presented in this paper.
本文介绍了核辐射使电子元器件失效的机制以及离子束分析技术在抗核加固研究中的若干应用。
The mechanism of radiation damage effects on electronic devices and the applications of ion beam analysis in the investigations of radiation hardening were presented in this paper.
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