Tip sample distance control system is the key part of scanning near field infrared microscopy.
针尖样品的距离控制系统是扫描近场红外显微镜的重要组成部分。
Influential factors were considered including specimen's surface state, ambient atmosphere, polarity, magnitude and method of tip sample applied voltage.
实验考虑了样品的表面状态，周围大气状况，所加电压的极性、大小和加压方式等影响纳米加工的因素。
Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.
原子力显微镜是运用一种微小的探针去“感受”样本表面，能得到高分辨率的影像（约5纳米的分辨率）。
However, instead of heating the entire sample, the researchers used a hot atomic force microscope (AFM) tip to convert very narrow ribbons, measuring just 12 nm across, into reduced graphene.
然而，研究人员并非采用加热整个样本的方案，而是使用了原子力显微镜(afm)一个加热探针去转换出一条仅有12纳米宽的导电带。
Tip: you can use any other package at your discretion, it doesn't matter for this sample.
提示：可以根据自已的决定使用任何其他包，这对本示例无关紧要。
The sample utilities provided and discussed in this article are the tip of the MetaWeblog iceberg.
本文中提供和讨论的示例实用工具只是强大的MetaWeblog的冰山一角。
As one of key techniques of SNOM, sample tip distance regulation is important and difficult to realize as well.
作为SNOM的关键技术之一，样品与探针间距的控制尤为重要，而实现起来比较困难。
We show the physical pictures about the interaction between the probe tip and sample and photon tunneling effect in PSTM.
给出了PSTM中探针针尖与样品相互作用和光子隧穿的物理图像。
This paper compared the effect of AFM tip to the sample surface under different imaging modes.
本文进一步分析讨论这种现象产生的原因，对比了不同成像模式下afm针尖对样品表面的影响。
Near-field optical microscopy, based on scanning sample surfaces by the tip of optical probe, obtained the imagined information about the object surface.
近场光学显微镜是利用探针的扫描来获得样品表面信息的。
Based on scanning sample surfaces using the tip of optical probe, it obtained the imagine information about the object surface.
它不用光学透镜成像，而用探针的针尖在样品表面上方扫描获得样品表面的信息。
Due to the small spring constant of the cantilever in direction perpendicular to the sample surface tip damage is reduced.
探针悬臂在垂直于样品表面方向上的弹性常数较小，针尖不易损坏。
The devices of the invention increase ease of sample volume control and, hence, application thereof while minimizing any sample spillage or fluid migration up the side of the dispensing tip.
本发明的装置使使用者更加容易地控制试样体积并因而更加容易地控制试样的施加，并且同时可最小化任何的试样溢出或流体在分配尖端侧部上的迁移。
SPM imaging mechanism is analyzed. The influence of the combination ofexternal vibration and tip-sample scanning movement on SPM imaging isidiscussed.
分析SPM扫描图像的形成机制，论述外界振动与针尖-样品扫描运动相互叠加从而影响SPM 成像的机理。
In the paper a kind of patterning method was studied with voltage applied between the AFM tip and sample with emphasis on its mechanism.
本文介绍了在AFM针尖与氢钝化硅表面之间施加电场作用对硅表面进行修饰的纳米加工方法，重点讨论了加工机理。
The interaction forces between the tip and sample is used to acquire 3-dimentional image of the samples in atomic force microscopy(AFM).
原子力显微技术利用探针尖端与标本之间相互作用的力场对标本进行三维成像。
This tip can be found in a booklet, Passport to the Pub: the Tourists' Guide to Pub Etiquette, a customers' code of conduct for those wanting to sample a central part of British life and culture.
这个忠告可在名为《酒吧护照：旅游者酒吧仪俗指南》的小册子中找到，它对那些想要领略英国生活和文化核心部分的人是一种行为准则。
Based on ASTF the influence of such parameters as tip-sample distance, tip aperture diameter and the incident Angle of illuminating laser beam on PSTM image has been discussed.
进一步根据角谱传递函数计算了不同样品的光子扫描隧道显微镜理论图像，分析了探针与样品的间距、探针孔径大小、照明光入射角等对光子扫描隧道显微镜成像的影响。
Based on ASTF the influence of such parameters as tip-sample distance, tip aperture diameter and the incident Angle of illuminating laser beam on PSTM image has been discussed.
进一步根据角谱传递函数计算了不同样品的光子扫描隧道显微镜理论图像，分析了探针与样品的间距、探针孔径大小、照明光入射角等对光子扫描隧道显微镜成像的影响。
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