The author improved the method obtaining STEM images by using the reflective target specimen stege in SEM, and gained better images than commonly adopted method.
作者改进了在扫描电镜中使用反射靶面透射样品座获得扫描透射电子象的方法，得到比通常的办法好得多的图象。
The author improved the method obtaining STEM images by using the reflective target specimen stege in SEM, and gained better images than commonly adopted method.
作者改进了在扫描电镜中使用反射靶面透射样品座获得扫描透射电子象的方法，得到比通常的办法好得多的图象。
应用推荐