But, because of the weakness of the fault model used and being not able to run at-speed, voltage based testing, generally speaking, is only good at verifying IC's functions.

但是，由于电压测试所使用的故障模型存在局限性，而且测试常常不能全速进行，因此一般来说，电压测试只善于验证电路的功能。

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But, because of the weakness of the fault model used and being not able to run at-speed, voltage based testing, generally speaking, is only good at verifying IC's functions.

但是，由于电压测试所使用的故障模型存在局限性，而且测试常常不能全速进行，因此一般来说，电压测试只善于验证电路的功能。

youdao