Their method is called tomographic phase microscopy, and it is reported in this week's Nature Methods.
这种方法被称为X射线断层扫描相位显微镜法（tomographic phase microscopy），并发表于本周的《自然·方法学》（Nature Methods）上。
Under phase microscopy, these cells appear to stumble slowly along the walls of the capillaries and venules to come finally to rest at some point.
在位相显微镜下，这些细胞沿着毛细血管和小静脉壁缓慢滚动，最后停留在一定的位点。
It is this phase shift that gives Dr Feld's new form of microscopy its name.
正是这种相位的变化让Feld博士的新型显微镜法有了自己的名字。
The sample's crystal phase, structure, morphology and the reaction process were characterized and analyzed by using X-ray diffraction(XRD), transmission electron microscopy(TEM).
采用X射线衍射（XRD）、透射电子显微镜（TEM）分析手段对样品的物相、结构、形貌进行了表征和分析。
Scaning electronics microscopy (SEM) was applied hereby to surface phase and elements analysis of the powder by precursor method and grain sample by microwave method.
用扫描电子显微镜(SEM)对粉料及微波合成的块体样品表面进行物相分析和元素的半定量分析。
A pseudo weak phase object approximation to the principle of image formation in high resolution electron microscopy is presented.
本文提出了高分辨电子显微象的赝弱相位物体近似。
Observation: 1. Phase contrast microscopy 2. S-100 immunostain 3. Cell's account.
观察：(1)相差显微镜，(2)S- 100免疫细胞化学染色，(3)细胞计数。
The microstructure and the phase composition of the alloy were analyzed through optical microscopy, SEM, EDAX and XRD techniques.
通过光学显微术、SEM、EDAX、XRD技术分析了热等静压对材料的显微组织和相成分的影响。
The phase compositions and characteristics of glass-ceramics products were determined by the comprehensive methods such as optical microscopy, X-ray diffraction, physical and chemical properties test.
通过光学显微分析、X射线衍射分析、物理化学性能测试等手段确定了微晶玻璃的物相组成及性能特征。
X-ray diffraction (XRD), atomic forced microscopy (AFM) and electronic diffraction spectroscopy (EDS) were respectively used to measure the morphologies, phase structures and composition.
通过X射线衍射（XRD）、原子力显微镜（AFM）、电子衍射能谱（EDS）等手段对薄膜进行了相的形成、结构特性及薄膜组成等的测试。
Conclusion the best strategy is to combine UF-100 and phase contrast microscopy for the localization of the sites of hematuria.
结论UF- 100与相差显微镜结合使用是血尿来源鉴别的最好策略。
The scanning electron microscopy (SEM) indicated that the adhesion at the interface could be enhanced by PP-HBP and the phase separation of PP/PVC blends could be reduced.
扫描电子显微镜（SEM）研究结果证明，PP-HBP增强了PP/PVC的界面粘结作用，减小了共混体系的相分离程度。
The resolution of Darkfield and Phase Contrast Microscopy is up to 10-500A.
暗视场及相衬显微术的分辨率可达10～500（?）
Being of the phase resolution power of nm level, the DIC microscopy can discern the microcosmic structure which cannot be observed by the ordinary microscopy.
微分干涉相衬显微镜具有纳米级的相位分辨率，可以看到一般光学显微镜难以观察到的微细结构。
Xray diffraction (XRD) was used for phase identifications and texture examinations, and the surface morphology was studied using scanning electron microscopy (SEM).
X射线衍射（XRD）用于相鉴定和纹理的考试，和表面形貌使用扫描电子显微镜（SEM）研究。
X-ray diffractometer, scanning electron microscopy and the Archimedes method et al. were used to investigate the phase composition, the microstructure, the density and so on of MgB2 samples.
利用X射线衍射仪、扫描电子显微镜和阿基米德方法等，分别研究了样品的物相组成、显微结构和密度等。
The phase composition and microstructure of mullite powders were investigated by X-ray diffraction and field emission scanning election microscopy techniques.
利用X射线衍射仪和场致发射扫描电子显微镜等手段对合成粉体的相组成、结构和形貌进行了研究。
The morphology of PC12 cells was observed by phase-contrast microscopy.
以倒置相差显微镜观察PC12细胞神经突起的变化；
To suppress the strong sidelobe intensity, these phase-only filters are used in the confocal scanning microscopy system and the .
考虑到强烈的旁瓣效应，把位相型滤波器应用于共焦扫描显微系统，提高了分辨率。
The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).
分别用电子探针（EPMA）、X衍射（XRD）和扫描电镜（SEM）查证了其组分、相结构和显微结构的梯度分布。
Methods:( 1 ) The morphologic changes of micrangium between the reverse-flow random flap with SVT and no SVT in different phase were observed by using optical microscopy, stereological methods.
方法：1．应用生物体视学原理和技术检测带浅静脉干的逆行皮瓣移植后早期微血管密度量的变化趋势，与不带静脉干逆行皮瓣作对照比较。
The structure change and phase transformation in reduction process were examined with scanning electron microscopy and Xray diffraction device.
采用扫描电镜和X射线来分析还原过程中的结构及物相变化。
The phase identification and surface morphology were investigated by X-ray diffraction and scanning electron microscopy.
用X射线衍射、红外光谱、扫描电镜等分析了薄膜的物相和表面形貌。
The phase structure, morphology and electrochemical performance were analyzed using X-ray diffraction (XRD), scanning electron microscopy (SEM) and galvanostatic charge-discharge cycling technique.
利用X射线衍射（XRD）、扫描电镜（SEM）和恒电流充放电测试技术测试了制备样品的相结构、微观形貌和电化学性能。
The phase structure, morphology and electrochemical performance were analyzed using X-ray diffraction (XRD), scanning electron microscopy (SEM) and galvanostatic charge-discharge cycling technique.
利用X射线衍射（XRD）、扫描电镜（SEM）和恒电流充放电测试技术测试了制备样品的相结构、微观形貌和电化学性能。
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