该测试方法能侦测到被测电路基本组成单元的任意组合失效；
The test approach can detect any combinational faults within basic cell of CUT.
CCD非接触测振系统由照明光源、成像系统、CCD、检测逻辑接口电路及计算机软件构成。
It consists of light source, imagery system, CCD, logic interface circuit and computer system.
系统根据引信时序电路中被测对象的特点和测试需求，建立了专用测试系统的硬件平台。
A hardware platform of special test system was constructed by the characteristic and test requirement.
温度控制装置用以控制受测集成电路的温度。
The temp control set controls the temp of the IC to be tested.
温度控制装置用以控制受测集成电路的温度。
The temp control set controls the temp of the IC to be tested.
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