A new method for measuring the life time of minority current carriers in semiconductors is described.

本文提出了一种新的测量半导体材料中少数载流子寿命的方法。

youdao

A new method for measuring the life time of minority current carriers in semiconductors is described.

本文提出了一种新的测量半导体材料中少数载流子寿命的方法。

youdao