Passengers must pass through metal detectors, and their carry-on bags are put through X-ray machines.
乘客必须通过金属探测器检测，其随身物品也必须经过X射线设备检测。
The raw coal sample and the treated coal sample with metal corrosion interaction method using infrared spectrum and X ray diffraction were analysed, respectively.
利用红外光谱和X射线衍射对金属腐蚀电偶法处理前后的煤样进行了分析。
It make a comeback as the first boss in Metal Slug X, but is colored military green instead of red.
它再度出现作为第一关头目在合金弹头X，但是被染成军绿色代替红色。
Taking the non-coaxial grazing incident KBA X-ray microscope designed as an example, X-ray reflecting from metal surface and single film layer is discussed.
以设计的非共轴掠入射KBAX射线显微镜系统为例，讨论了掠入射下X射线从金属表面和单层膜表面反射的两种情况。
What if there was a simple and quick way to avoid all the hassle of having to take off all metal objects, coats, belts and shoes in order for them to be scanned in the X-ray machine?
如果有一种简单而快捷的方法，可以避免所有的金属物体、服装、腰带还有鞋子等等，在通过X射线仪器扫描时发生的争吵？
Two novel divalent transition metal disulfonates were synthesized and characterized by X ray single crystal diffraction.
合成了两个二价的过渡金属磺酸化合物，并通过X -射线衍射单晶结构分析进行结构表征。
These windows use the standard Aqua window look and features; if the application is running in versions of Mac OS X prior to v10.5 (Leopard), these windows can use the optional brushed metal look.
这些窗口使用标准的水上窗口的外观和功能，如果应用程序在MacOSX版本运行之前v10.5（豹），这些窗口可以使用可选的拉丝金属外观。
The Hozmi is the fifth boss from Metal Slug 2 and Metal Slug X.
穗积是合金弹头2和合金弹头X第五个头目。
The Dragon Nosuke is the third boss from Metal Slug 2 and Metal Slug X.
龙柱是合金弹头2和合金弹头X第三个头目。
A metal artifacts reduction method using nonlinear weights was developed to suppress metal artifacts in X-ray CT(computerized tomography) images to improve the image quality.
为抑制计算机层析造影（CT）系统重建图像中出现的金属伪影，提高图像的质量，采用一种基于金属投影非线性权重衰减的方法进行校正。
Direct testing for a passive surface can be accomplished by X-ray Photoelectron Spectroscopy (XPS) testing which is used to measure the oxidation states of elements found on the metal surface.
钝化表面的直接检测可通过X射线光电子光谱法(XPS)检测来实现，该方法通常用于金属表面发现的元素的氧化状态。
X-ray computed tomography (CT) reconstructions are often limited by metal artifacts from corrupted data.
射线CT系统的成像质量往往受到金属伪影的严重影响。
The methods of visual inspection, SEM, X-ray EDS, metallography and chemical composition analysis were adopted to research the rupture of flexible metal hose.
采用宏观检查、扫描电镜、X射线能谱、金相检验、化学成分分析等方法，对金属波纹软管开裂的原因进行分析。
Meanwhile, some new conclusions in favor of designs on metal grating under grazing incidence in soft X-ray region were obtained.
同时，得到了一些优化软x射线波段掠入射金属光栅设计的新结论。
In comparison with laser plasma soft X-ray sources using metal target, the light source is debris-free.
与金属靶激光等离子体软x射线源相比，此光源无碎屑。
The precise formulas, for calculating thickness of X-ray balanced filters made from metal foils or oxide-plastic films are deduced from the principle.
本文从平衡滤光片的原理，推导了金属片型和塑料氧化物型平衡滤光片的最佳厚度计算公式。
The researchers used X-ray crystallography to compare the various structures, identify the differences and understand the mechanism that removes heavy-metal toxins from cells.
研究人员利用X射线衍射晶体分析法比较不同的结构来确定差异，弄清楚了细菌移除重金属毒物的机制。
Due to the security purpose, the relevant equipment such as CCTV, X-ray machine, metal detector, card reader are also included for operation.
基于保安问题，有关设备如CCTV、x光机、金属探测器及读卡机等等设备同时投入运作。
Introduce technology and the application of portable high-precision X-ray fluorescence analyzer for prospecting of metal mine in Jingxian of Anhui province.
介绍了高精度便携式X荧光分析仪在安徽泾县金属矿勘查中的应用效果。
The surface structures of uranium metal and triuranium octaoxide (U3O8) and the influence of carbon monoxide to the surface layers have been studied by X-ray photoelectron spectroscopy (XPS).
用X射线光电子能谱（XPS）分析研究了金属铀表层和八氧化三铀的表面结构以及一氧化碳对其表面结构的影响。
Now, in the industry manufacture and equipment testing, there are several methods for the metal thickness measurement, as ultrasonic, X-ray, eddy current and so on.
目前，在工业生产和设备检测中，对于金属板材或者金属设备的厚度测量，通常有超声、射线、电磁涡流等不同方法。
Measurement of coating thickness in the proof-test of IC packages and metal cases using X-Ray Fluorescence (XRF) spectrometry is described.
介绍了在外壳检验中，应用X射线荧光光谱法（XRF），对外壳的镀涂层厚度进行测试；
Measurement of coating thickness in the proof-test of IC packages and metal cases using X-Ray Fluorescence (XRF) spectrometry is described.
介绍了在外壳检验中，应用X射线荧光光谱法（XRF），对外壳的镀涂层厚度进行测试；
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