The System can accomplish analyzing and identifying 3-d measurement error coming form machine tools and semiconductor manufacturing equipment in hours.
该系统可在几小时内完成机床和半导体制造设备的三维空间误差评估。
The System can accomplish analyzing and identifying 3-d measurement error coming form machine tools and semiconductor manufacturing equipment in hours.
该系统可在几小时内完成机床和半导体制造设备的三维空间误差评估。
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