New methods of measurements of specimen thickness and non-elastically scattering mean free path are proposed based on the electron holograph combining with electron dynamic diffraction.
而且，在电子全息照片和电子动力衍射相结合的基础上我们提出了一种测量电镜样品厚度和样品非弹性散射自由程的新方法。
New methods of measurements of specimen thickness and non-elastically scattering mean free path are proposed based on the electron holograph combining with electron dynamic diffraction.
而且，在电子全息照片和电子动力衍射相结合的基础上我们提出了一种测量电镜样品厚度和样品非弹性散射自由程的新方法。
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