Based on the dispersion equations, 'Downhill Simplex' method is utilized to measure the thickness and optical constants of thin film by fitting the curve of measured transmission spectrum.
借助于不同的色散公式，运用单纯形法拟合测得的透过率光谱曲线，从而获得薄膜的光学常数和厚度。
Based on the dispersion equations, 'Downhill Simplex' method is utilized to measure the thickness and optical constants of thin film by fitting the curve of measured transmission spectrum.
借助于不同的色散公式，运用单纯形法拟合测得的透过率光谱曲线，从而获得薄膜的光学常数和厚度。
应用推荐