A principle and experimental method of detecting material defects by photothermal technique is researched in this paper.
对光热技术测量材料缺陷的原理及实验方法进行了研究。
As the detecting material of uncooled infrared detectors, vanadium oxide (VOX) thin films need high temperature coefficient of resistance (TCR) and suitable film resistance for using of the device.
氧化钒薄膜作为非制冷红外探测器的热敏材料，要求具有高的电阻温度系数(TCR)与合适的电阻值，以满足器件的应用。
As the detecting material of uncooled infrared detectors, vanadium oxide (VOX) thin films need high temperature coefficient of resistance (TCR) and suitable film resistance for using of the device.
氧化钒薄膜作为非制冷红外探测器的热敏材料，要求具有高的电阻温度系数(TCR)与合适的电阻值，以满足器件的应用。
应用推荐