The digital logic chip of the invention and the method of design for testing can realize the observation of circuit scanning test by adopting few pins.
本发明的数字逻辑芯片及其可测试设计的方法，能够通过少量管脚实现电路在扫描测试时的可观测。
The digital logic chip of the invention and the method of design for testing can realize the observation of circuit scanning test by adopting few pins.
本发明的数字逻辑芯片及其可测试设计的方法，能够通过少量管脚实现电路在扫描测试时的可观测。
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