研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构，例如原子力显微镜、电子扫描显微镜和X射线衍射。
The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.
通过X射线衍射、拉曼散射、原子力显微分析(afm)等表征方法研究薄膜结构与生长条件的关系。
The relationship between thin films structure and preparation parameters was studied by X-ray diffraction, Raman scattering and AFM.
利用原子力显微镜、能量散射X射线谱、X射线衍射和交变梯度磁强计研究了该颗粒膜材料的结构和磁学性质。
The structural and magnetic properties of the granular film are studied by atomic force microscope, energy dispersion X-ray spectrum, X-ray diffraction, and alternating gradient magnetometer.
该薄膜的表面形态和特征采用扫描电子显微技术(SEM)，X射线衍射(XRD)以及原子力显微技术(afm)描述。
The surface morphology and characteristics of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM).
同时，用X射线衍射(XRD)、原子力显微电镜(afm)和透射电镜(TEM)对薄膜的微观结构进行了分析。
In addition, the microstructure of the MgO thin films were examined with X-ray diffraction (XRD), Atomic Force Morphology (AFM) and Transmission Electron Micrograph (TEM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
麦克斯韦方程组：洛仑兹力，平面电磁波，辐射，光波，反射，折射，惠更斯原理，衍射，干涉现象。
Maxwell equations: Lorentz force, plane electromagnetic waves, radiation, light waves, reflexion, refraction, Huyghens principle, diffraction, interference phenomena.
本文采用原子力显微镜和X射线粉末衍射仪研究了PVA溶液旋转涂膜的溶剂化效应。
The solvent effect on the preparation of PVA film by low speed spin machine was studied by using AFM and XRD.
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
用X射线衍射来表征晶体的结构，用原子力显微镜来表征表面形貌。
The crystal structure is characterized by X-ray diffraction (XRD) and the morphological characterizations are observed by atomic force microscopy (AFM).
通过四晶X射线衍射、化学腐蚀、光学显微、透过光谱以及原子力显微镜对晶体的质量进行了表征。
The crystal was characterized by four-crystal X-ray diffraction, chemical etching, optical microscope, transmission spectra and atomic force microscope (AFM).
通过X射线衍射（XRD）、原子力显微镜（AFM）、电子衍射能谱（EDS）等手段对薄膜进行了相的形成、结构特性及薄膜组成等的测试。
X-ray diffraction (XRD), atomic forced microscopy (AFM) and electronic diffraction spectroscopy (EDS) were respectively used to measure the morphologies, phase structures and composition.
X射线衍射仪、电子能谱仪、原子力显微镜和椭圆偏振仪等研究薄膜的击穿电压、介电常数、晶体结构、化学成分、表面形貌及薄膜的折射率。
The breakdown voltage, permittivity, crystal structure, composition, surface and refractive index of the thin films were studied by I-V, C-V, XRD, EDS, AFM and elliptical polarization instrument.
本文分别用原子力显微镜、双束紫外可见分光光度计、X-衍射仪等表征了用以上两种方法制备的三氧化钨薄膜。
The tungsten oxide films by two methods were characterized by atomic force microscope, double-beam UV-VIS-NIR spectrophotometer and X-diffractometer.
本文分别用原子力显微镜、双束紫外可见分光光度计、X-衍射仪等表征了用以上两种方法制备的三氧化钨薄膜。
The tungsten oxide films by two methods were characterized by atomic force microscope, double-beam UV-VIS-NIR spectrophotometer and X-diffractometer.
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