利用模拟寿命试验的失效数据，统计推断产品的寿命分布函数是可靠性技术中的重要环节。
Making use of the failure datum of analog life test, it is an important link in reliability technique to reckon statistically the life distribution function.
指数分布是一种可以很好地描述某些电子元件的寿命的分布函数。
An index distribution is a distributing function which can describe the life-span of some electronic elements well.
本文讨论了ST函数在产品、系统寿命分布检验中的应用，并提供了一个实例。
This paper describes st function and its application in the test for products, system life distribution. Finally, a real example is given.
当产品的寿命分布为指数分布时，其密度函数为，(2)其中为指数分布的失效率。
Exponential distribution: the density function is as follows, (2) in which is the failure -rate of the.
本文通过应变分布对寿命的影响函数分析，导出了一种适用于应力疲劳和应变疲劳的通用寿命模型。
A general life model adapted to both stress fatigue and strain fatigue is deduced, through analyzing the influence function of strain distribution on life.
本文通过应变分布对寿命的影响函数分析，导出了一种适用于应力疲劳和应变疲劳的通用寿命模型。
A general life model adapted to both stress fatigue and strain fatigue is deduced, through analyzing the influence function of strain distribution on life.
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