电源网格上存在着三种主要的物理效应,其中压降效应和地弹反射效应影响信号的完整性,电子迁移效应影响芯片设计的可靠性。
There are three physical effects on the power grid. Among them, IR-Drop effect and ground bounce effect impact the signal integrity while electro-migration impacts the reliability of VLSI design.
电源网格上存在着三种主要的物理效应,其中压降效应和地弹反射效应影响信号的完整性,电子迁移效应影响芯片设计的可靠性。
There are three physical effects on the power grid. Among them, IR-Drop effect and ground bounce effect impact the signal integrity while electro-migration impacts the reliability of VLSI design.
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