给出了俄歇表面结构分析的许多应用。
俄歇表面电子结构研究。
用俄歇能谱仪对注入层的成分进行了分析。
The composition of the implanted layer was analysed with Auger electron spectroscopy.
用俄歇能谱aes分析了合金钝化膜的组成。
俄歇表面结构分析。
确保你的俄歇刀片是夏普和不要忘记你的住房或鱼府执照。
Make sure your auger blades are sharp and don't forget about your shelter or fish house license.
用俄歇电子谱(aes)分析了铀试样处理前后表层的成分变化。
The composition of surface layer of uranium and treated uranium have been analyzed respectively by Auger Electron Spectroscopy (AES).
讨论了用俄歇深度剖面分布作超晶格结构分析的特点及其局限性。
The characteristics of Auger depth profile as a method for superlattice structure analysis, as well as its limitations, are discussed.
还确定了典型工艺条件，并用俄歇电子能谱分析了硅化钛膜的组分。
The typical growth condition is also determined. The composition of titanium silicide films is analysed…
俄歇电子谱仪广泛地利用来确定固体表面的化学和电子结构(40A)。
Auger electron Spectrscopy (AES) has widespread use in determining the chemical and electronic structure of solid surface (40a).
用俄歇谱及分子束技术就地与非就地研究了蒸发稀土金属镧薄膜的表面特性。
The surface characteristics of evaporated rare-earth metal la thin film were studied by ex-situ and in-situ AES and molecular beam technique.
再用PHI 550型俄歇电子能谱仪测出上述样品金膜中银的浓度剖面分布。
After that the above samples have been analysed by AES (type PHI 550) and silver concentration profiles in the gold films have been obtained.
从铜-镍合金的俄歇谱分析可知，合金能带的刚性能带理论并不适合本研究系统。
The analysis of Auger spectra of Cu, Ni and Cu-Ni alloy also shows that the "Rigid Band Model" is not suitable for Cu-Ni system.
俄歇电子发射，表面灵敏性，俄歇电子谱的测量，定性和定量分析，深度剖析等。
The content of this article includes Auger electron emission, surface sensitivity, measurement of Auger electron spectrum, qualitative and quantitative analysis, depth profile etc.
采用扫描电镜、能量色散谱和俄歇电子能谱检测方法，对银币表面缺陷进行了分析。
The surface defects of silver COINS was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).
用俄歇电子能谱（AES）研究了高真空下，环境温度对铀铌合金真空氧化膜的影响。
The heated oxidation film of U-Nb alloy is studied by auger electron spectroscopy (AES) at different temperature in the high vacuum chamber.
这一结论得到了俄歇电子能谱分析的佐证，因为在浸泡过的膜的外层发现有铬的存在。
This conclusion is supported by Auger electron spectroscopy data, which show a chromium uptake in the outer layers of the immersed films.
利用X射线衍射(XRD)和俄歇电子衍射(AES)观察了表面膜的化学成分及结构。
The structure and chemical compositions of the surface oxide film were investigated by XRD and Auger electron spectrometry (AES).
实际建立的系统包括激光器、外光路系统、真空制样室、俄歇能谱仪、电子发射测量仪。
The total system comprise laser, external ray system, vacuum chamber, AES and emission electron surveyor.
用XPS测量了分散在碳箔载体上的金属钴和氧化钴的钴内层电子结合能和俄歇电子动能。
The core level binding energies and Auger energies of highly dispersed Co metal and CoO on carbon foil have been determined by using XPS.
沿垂直膜面俄歇电子（AES）逐层分析证明，优化溅射工艺制备的薄膜化学成分分布均匀。
The results of AES analyses proved that the optimized composition is uniform along the cross-sections of the film.
结合俄歇电子能谱和红外光谱分析膜的微观结构，对薄膜的电子注入特性进行了理论分析与讨论。
The characteristics of the electron_injected film were analyzed and discussed, in terms of the microstructure analyses in the film with the Auger electron spectroscopy and the infrared spectrum.
给出了利用JAMP - 10型俄歇电子谱仪进行定量分析(包括深度定量分析)的一些结果。
Some results of quantitative analysis, including depth quantitative analysis, on Model JAMP-10 Auger Electron Mieroprobc are given.
本文对数控车削纯镍时刀具的沟槽磨损问题，应用扫描电镜、电子探针、俄歇能谱仪等进行了探讨。
Using electronic sweep mirror, electronic prober and energy spectrum meter to investigate the groove shape wear of a cutting tool, while numerical controlled turning the pure nickle.
在考虑了俄歇效应的情况下，用行波速率方程组研究了半导体激光器的输出功率与端面反射率的关系。
Taking into account the Auger effect, the output-enhancement coatings applied to the facets of the semiconductor lasers have been investigated using a set of travelling wave rate equations.
影响层的厚度为30—50埃，它是进行深度剖面分析时，决定元素俄歇信号强度的第一位重要因素；
The dominant factor for Auger signal during the interface analysis is the altered layer with a thickness of 30-50A rather than the electron mean free path X.
本文介绍了用扫描电子显微镜和俄歇电子谱仪观察和分析雾化态和热等静压态高温合金粉末颗粒的表面。
An investigation of the surface of Ni-base superalloy powder particles in both as-atomized and as-HIP' ed conditions has been presented in the paper.
当阱宽较大时，能级填充是导致光谱红移的主要原因，俄歇复合与载流子离域是导致效率下降的主要原因。
But as the well width increase, level filling is the main reason for the red-shift of spectrum, Auger recombination and carrier delocalization are the main reason for lower efficiency.
用俄歇电子能谱 （AES）研究高真空室中纯铁和多能量叠加注碳纯铁表面与氧气吸附及初始氧化过程。
The initial oxidation of pure iron and implanted samples which were overlapped energy ion–implanted with C ions was studied by auger electron spectroscopy (AES).
用俄歇电子能谱 （AES）研究高真空室中纯铁和多能量叠加注碳纯铁表面与氧气吸附及初始氧化过程。
The initial oxidation of pure iron and implanted samples which were overlapped energy ion–implanted with C ions was studied by auger electron spectroscopy (AES).
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