The sources of the endemic fluorosis in Weixin, Zhaotong of Yunnan Province has been studied using an ion selective electrode(ISE) and X-ray diffraction analysis(XRD).
运用离子选择性电极（ISE）和X射线衍射分析（XRD）方法，对云南昭通威信地方病氟中毒区的氟源进行了研究。
X ray Diffraction (XRD) was employed to determine the phases presented in the modified layer.
利用X射线衍射(XRD)分析表面改性层结构的变化。
X ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and photoluminescence (PL) are used to analyze the synthesized GaN nanorods.
用X射线衍射（XRD）、扫描电镜（SEM）、高分辨率透射电镜（HRTEM）和光致发光光谱（PL）对生成的产物进行了分析。
Transmission electron microscope (TEM), Raman spectroscopy and X ray diffraction (XRD) were used to investigate the lattice structures, phonon properties of the samples.
通过透射电境、X光衍射和拉曼散射对纳米晶的晶格结构和声子特性进行了研究。
The resultant surfaces were characterized by means of SEM, transmission electron microscopy (TEM), X-ray diffraction (XRD), and water contact Angle measurements.
用扫描电镜、透射电镜、X射线衍射、接触角测量等技术对表面进行了表征。
The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.
运用能谱技术（EDXA）、X射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
The structure, surface morphology and the optical properties were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM) and photoluminescence (PL).
用X 射线衍射（XRD）、扫描电镜（SEM）、荧光光谱（PL）对样品进行结构、形貌和发光特性的分析。
Scanning electron microscope (SEM) and X-ray diffraction (XRD) were used to measure the surface morphology, the crystal microstructure and the distribution of diamond grain in the film.
用扫描电镜(sem)和X射线衍射(XRD)方法检测了复合膜的表面形貌、晶体显微结构和复合膜中金刚石颗粒的分布情况。
They were characterized by X-ray powder diffraction (XRD), transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM).
产物经x -射线粉末衍射(XRD)、透射电子显微镜(TEM)和高分辨电子显微镜(HRTEM)表征。
The influences of temperature, catalysts and moisture on microcrystallite structure of pyrolysis gasification semicoke were investigated using X-ray diffraction(XRD).
采用X-射线衍射（XRD）法分别考察了温度、催化剂和水分对生物质热解气化半焦微晶结构的影响。
The surface morphology and characteristics of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM).
该薄膜的表面形态和特征采用扫描电子显微技术(SEM)，X射线衍射(XRD)以及原子力显微技术(afm)描述。
The sample's crystal phase, structure, morphology and the reaction process were characterized and analyzed by using X-ray diffraction(XRD), transmission electron microscopy(TEM).
采用X射线衍射（XRD）、透射电子显微镜（TEM）分析手段对样品的物相、结构、形貌进行了表征和分析。
The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .
用x射线衍射（XRD）、扫描电镜（SEM）和x光电子能谱（XPS）对样品进行了结构、形貌及组分分析。
Gel permeation chromatography (GPC), Fourier transform infrared spectrometer (FT-IR), X-ray diffraction (XRD) were adopted to characterize and analyze the degraded products.
用凝胶渗透色谱(GPC)、傅立叶变换红外光谱(FT - IR)和X射线衍射(XRD)对降解产物进行表征分析。
The structural change of PAN based carbon fibre by an electric current pulse was studied by means of X-ray diffraction(XRD) and transmission electron microscopy(TEM).
用X射线衍射（XRD）、透射电子显微镜（TEM）等技术研究了PAN基碳纤维在单电流脉冲作用下的结构变化。
Structures and properties of these materials were studied by X-ray diffraction (XRD) analysis, scanning electronic microscopy (SEM) observation and differential scanning calorimetry (DSC) analysis.
并采用X—射线衍射分析、扫描电镜和差热差重分析，研究了复合蓄热材料的性能和结构。
The microstructure? Element distribution and phase after hot-corrosion were analysed by means of X-ray diffraction (XRD) and scanning electron microscope (SEM).
利用X射线衍射(XRD)和扫描电镜(sem)等手段，对高温熔盐热腐蚀后的组织形貌、元素分布及物相进行了分析。
In addition, the microstructure of the MgO thin films were examined with X-ray diffraction (XRD), Atomic Force Morphology (AFM) and Transmission Electron Micrograph (TEM).
同时，用X射线衍射(XRD)、原子力显微电镜(afm)和透射电镜(TEM)对薄膜的微观结构进行了分析。
The phase structure and microstructure of samples under different heating rates were investigated by X-ray diffraction (XRD) and scanning electron microscope (SEM) etc.
用X射线衍射仪（XRD）以及扫描电镜（SEM）等研究了试样在不同预设升温速度下的相结构和显微组织。
They have been characterized respectively by transition electronic microscope (TEM), X-ray powder diffraction (XRD), field induced surface photovoltage spectrum (FISPS).
对其进行了透射电镜(tem)、X射线粉末衍射(XRD)，场诱导表面光电压谱表征(FISPS)。
X-ray powder diffraction(XRD), scanning electron microscopy(SEM), transmission electron microscopy(TEM) and photoluminescence spectra were used to characterize the resulted BAM phosphor.
通过X射线粉末衍射（XRD）、扫描电镜（SEM）、透射电镜（TEM）以及荧光光谱对获得的试样进行了表征。
The different resins filling with thermoplastic starch were analyzed by X-ray diffraction and XRD.
通过对添加不同的树脂改性热塑性淀粉进行X射线衍射XRD图象分析；
The roasting kinetics of copper sulfide concentrate is investigated with the differential thermal analysis (DTA), thermo-gravimetry (TG) and X-ray diffraction (XRD).
采用DTA ，TG结合X -射线衍射分析，对硫化铜精矿的焙烧的动力学进行了研究。
The morphology, structure, and photoluminescence(PL) of the phosphors were investigated by transmission electron microscope(TEM), X-ray diffraction(XRD), emission spectra, and decay time.
以X射线衍射（XRD）、透射电子显微镜（TEM）、发射光谱和衰减时间谱等手段表征材料性能。
The X-ray diffraction (XRD), excitation, emission and phonon side band spectra of the upper and lower parts of crystals were measured.
测定了晶体下部与上部的X射线衍射图（XRD）、激发光谱、荧光光谱以及声子边带谱。
The obtained samples were characterized by scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FT-IR), X-ray diffraction (XRD), and thermogravimetric analysis (TGA).
所得样品用扫描电镜(SEM)、傅立叶红外光谱(FT - IR)、X射线衍射(XRD)和热重分析(TG)等分析方法进行了表征。
The prepared product has been characterized by means of X-ray diffraction (XRD) and scanning electron micrography (SEM).
通过X射线粉末衍射（XRD）和扫描电子显微镜（SEM）对产物进行了表征。
The structure of organo clays and mechanism for their adsorption were studied by X ray diffraction(XRD) and BET area.
通过X-衍射分析等手段探讨了有机粘土的结构及其吸附机理。
X-ray diffraction (XRD) and scanning electronic microscope (SEM) have been used to characterize the phase, orientation and surface morphology.
射线衍射和扫描电镜分别用于表征膜的物相、取向和表面形貌。
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