The localization of activity of immobilized glucose oxidase (GOD) was studied by X ray microanalysis.
利用X射线微区分析 ，对固定化青霉素G酰化酶的活性进行了定位分析。
The imaging principle of X-ray fluorescent tomography and its application in microanalysis field are introduced simply.
介绍了X射线荧光层析成像技术的成像原理及其在微量分析领域中的应用。
The localization of the activity of immobilized glucose oxidase on chitosan membrane was studied by X-ray microanalysis.
利用X射线微区分析方法，对壳聚糖固定葡萄糖氧化酶活性进行定位分析。
The localization of the activity of immobilized urease on chitosan membrane was studied by X-ray microanalysis.
利用X射线微区分析方法，对壳聚糖固定化脲酶活性进行了定位分析。
Effects of aluminum on nutrient elements absorption and distribution of both wheat cultivars seedlings were compared by the nutrient element determination and X-ray microanalysis.
采用元素含量测定和X -射线微区分析的方法，比较了铝胁迫对两小麦品种幼苗营养元素吸收和分布的影响。
The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).
分别用电子探针（EPMA）、X衍射（XRD）和扫描电镜（SEM）查证了其组分、相结构和显微结构的梯度分布。
The leaf epidermal microstructure among 12 perennial grasses was studied by using scanning microscope and Energy Dispersive X-ray (EDX) microanalysis.
用递真空扫描电镜技术和能量分散型X射线（EDX）分析方法研究了12种多年生牧草叶表面的微细构造。
The compositions of the coatings were analyzed by energy dispersive X-ray microanalysis system (EDS). The morphology of the coatings was observed by scanning electron microscopy (SEM).
采用能量色散x射线谱(EDS)分析得出涂层成分，利用扫描电子显微镜(SEM)观察涂层形貌。
The compositions of the coatings were analyzed by energy dispersive X-ray microanalysis system (EDS), and the morphology of the coatings was observed by scanning electron microscopy (SEM).
采用能量色散x射线谱(EDS)分析得出镀层成分，利用扫描电子显微镜(SEM)观察镀层形貌。
With using the methods of light and scanning electron microscopy and X-ray microanalysis it was shown that a critical level of cartilage calcification is need to activate osteoclasts.
使用该方法的光线和扫描电子显微镜和X -射线微结果表明，一个关键的软骨钙化是需要激活破骨细胞。
The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.
采用电子探针及X射线衍射仪测定了可锻铸铁白口组织中硅的分布和硅对渗碳体点阵参数的影响。
Phases constitution, microstructure and element distribution of the coating were studied by X-ray diffraction(XRD), scanning electron microscope(SEM) and electron probe microanalysis(EPMA).
通过X射线衍射分析（XRD）、扫描电镜（SEM）等观察分析了复合粉涂层表面形貌，分析了表面微裂纹和孔隙的形成过程。
Introduction to the theory of X-ray microanalysis through the electron microprobe including ZAF matrix corrections.
利用包含ZAF基体修正的电子探针，介绍X射线显微分析的理论。
Introduction to the theory of X-ray microanalysis through the electron microprobe including ZAF matrix corrections.
利用包含ZAF基体修正的电子探针，介绍X射线显微分析的理论。
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