This paper deals with X-ray diffraction profile analysis for the sample with a micro-strain gradient in its surface layer.
本文讨论了样品表面层有微观应变梯度时X射线衍射线形分析的方法。
The common background method dealing with the background of diffraction profile was presented to increase the efficiency of X-ray stress measurement.
为了提高X射线应力分析的效率，提出了公用背底法对衍射线进行背底扣除。
The common background method dealing with the background of diffraction profile was presented to increase the efficiency of X-ray stress measurement.
为了提高X射线应力分析的效率，提出了公用背底法对衍射线进行背底扣除。
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