The product of FSP is characterized by transmission electron microscopy (TEM) and X-ray powder diffractometer (XRD).
通过透射电镜(tem)和x -射线衍射仪(XRD)对所得片状银粉产物进行了表征。
The product of FSP is characterized by transmission electron microscopy (TEM) and X-ray powder diffractometer (XRD).
通过透射电镜(tem)和x -射线衍射仪(XRD)对所得片状银粉产物进行了表征。
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