These should be very useful to the soft X ray contact microscopy in air and the soft X ray scanning transmission microscopy.
这些结果将十分有益于大气环境下的软X射线接触显微术及软X射线扫描透射显微术的研究。
The failure of the powder metallurgy valve seat was analyzed by optical microscopy, scanning electronic microscopy, X-ray energy spectrum and X-ray diffraction.
采用力学、物理性能测试，金相、扫描电镜、能谱和X衍射分析研究了气门座圈产品失效的主要原因。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .
用x射线衍射（XRD）、扫描电镜（SEM）和x光电子能谱（XPS）对样品进行了结构、形貌及组分分析。
Then their structures and composing are analyzed by Fourier transform infrared spectroscopy(FT-IR), X-ray diffraction(X-RD), scanning electron microscopy(SEM).
红外光谱、X-射线衍射、扫描电镜分析其结构与组成，对膜进行降解性、溶涨性和兔眼生物相容性实验研究。
The obtained products were characterized by X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM).
合成产物用粉未衍射（XRD）X-射线光电子能谱（XPS）和扫描电子显微（SEM）表征。
The prepared product was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscope (TEM) and X-ray photoelectron spectroscopy (XPS).
利用X射线衍射(XRD)、扫描电镜(sem)、透射电镜(tem)和X射线光电子能谱(XPS)对制备的产品进行了表征。
The prepared powders and the green and sintered hollow-fiber membranes were characterized by thermal analysis, X-ray diffraction, scanning electron microscopy and X-ray energy dispersive spectroscopy.
用热分析、X射线衍射仪、扫描电镜、X射线能谱等技术对制备的粉体、烧结前后的中空纤维膜进行了表征。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
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