The VLSI testing is being pushed to the high-level based technology.
VLSI集成电路芯片测试技术正在向高层次测试推进。
Two main aspects in VLSI testing, fault simulation and test generation, are researched in this dissertation.
本文对VLSI测试中的两个主要问题—故障模拟和测试产生进行了深入的分析和研究。
Two main aspects in VLSI testing, fault simulation and test generation, are researched in this dissertation.
本文对VLSI测试中的两个主要问题—故障模拟和测试产生进行了深入的分析和研究。
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