New requirements are presented to interconnection integration technology because of the decreasing feature dimension in VLSI devices.
随着VL SI器件特征尺寸的缩小，对互连集成技术提出了新的要求。
With the unceasingly improvement of integration, speed and performance of VLSI devices, ATE is expected to have high reliability, strong adaptability and low cost as well as high performance.
随着VLSI器件的集成度、速度、性能的不断提高，人们对自动测试发备(ate)的要求也越来越高，这主要表现高性能、高可靠性、强适应能力、低成本等方面。
Semiconductor device simulation has manifested its ever-increasing importance for the design of miniature devices in VLSI end new discrete devices.
半导体器件模拟，对于设计VLSI中的微小尺寸器件或者是新型的半导体分立器件，都已越来越显得重要。
As the geometric sizes of the components and devices in modern digital VLSI circuits are especially reduced further, the noise influence on the VLSI circuits tends to be remarkable.
特别指出了随着现代数字VL SI电路的元器件几何尺寸进一步缩小，其内部噪声的影响趋于显著。
As the geometric sizes of the components and devices in modern digital VLSI circuits are especially reduced further, the noise influence on the VLSI circuits tends to be remarkable.
特别指出了随着现代数字VL SI电路的元器件几何尺寸进一步缩小，其内部噪声的影响趋于显著。
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