The experiment results show that the damage power threshold of IC fit normal distribution, and the variance is very small, so the damage probability fits 0-1 distribution.
器件损伤功率阈值基本呈正态分布,且方差较小,因此,器件的损伤概率近似于0 ~ 1分布。
The experiment results show that the damage power threshold of IC fit normal distribution, and the variance is very small, so the damage probability fits 0-1 distribution.
器件损伤功率阈值基本呈正态分布,且方差较小,因此,器件的损伤概率近似于0 ~ 1分布。
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