Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
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