SEM investigations revealed that the tin thin film electrode appeared serious cracks after 30 charging and discharging cycles.
SEM研究表明30次充放电循环后薄膜锡负极出现龟裂现象。
SEM investigations revealed that the tin thin film electrode appeared serious cracks after 30 charging and discharging cycles.
SEM研究表明30次充放电循环后薄膜锡负极出现龟裂现象。
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