The relation of stress time to parameter degradation is investigated under the condition of reverse bias of base-emitter junction.
在基极-发射极反向偏置的条件下，研究了应力作用时间与器件参数的退化关系。
The relation of stress time to parameter degradation is investigated under the condition of reverse bias of base-emitter junction.
在基极-发射极反向偏置的条件下，研究了应力作用时间与器件参数的退化关系。
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