A fast three-step path planning algorithm was proposed for automatic optic system to inspect electronic product defects by using surface mount technology.
针对检测表面贴片产品缺陷的光学检测系统，提出一种三阶段的快速路径规划算法。
A fast three-step path planning algorithm was proposed for automatic optic system to inspect electronic product defects by using surface mount technology.
针对检测表面贴片产品缺陷的光学检测系统，提出一种三阶段的快速路径规划算法。
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