An electrical current pulse applied to a thin conductive film heats the modulator section and the stationary phase within it, releasing a certain number of retained substances as concentration pulses.
施加到导电薄膜上的电流脉冲将调制器段及其内部的固定相加热，释放出作为浓度脉冲的保留物质。
After proper heat treatment the steel will have a dual phase structure of austenite and bainite. arranged alternatively in the form of lath ferrite and thin film austenite.
经适当热处理，获得贝氏体铁素体板条与奥氏体薄膜交替排列的奥氏体-贝氏体双相组织。
Bad control of oil phase flow will cause too thick or thin of external oil film, which will affect the product performance.
油相流量控制不好，会导致外部的油膜过厚或过薄，影响产品性能。
One of them is pure evaporation heat transfer model in the extended thin film region near the triple-phase contact line of vapor-liquid-solid at lower input heat flux.
一种是较低热负荷下的单一的微槽内三相接触线附近薄液膜区域中薄液膜的高强度蒸发换热机制（纯蒸发模式）；
The scatter rate of sulphur vacancy in thin film electroluminescent device is calculated through phase shift analysis. The results are compared with other scatter mechanisms.
利用分波法计算了薄膜电致发光器件中硫空位对电子的散射速率，并将其与其它散射机制进行了比较。
The temperature field design for a reflecting coating and phase change optical disk thin film is given.
还给出了相变膜的写入、擦除功率和激光反射膜的破坏阈值。
Sn and Sb can form complete solid solution, so no single phase of either Sb or Sn was found in SbSn thin film.
锑锡薄膜的制备过程中发现，薄膜成份为单相的锑锡合金，未出现金属锑或锡的单相，这是由于锑与锡易于形成完全固溶体的原因。
A dispersive white-light spectral interferometer for precise measurements of the phase properties of multilayer thin film structures is built.
本文搭建了一个用于精确测试光学薄膜位相特性的色散式白光频谱干涉仪。
Further disclosed is a process for fabricating an organic thin-film transistor device, preferably by relative low-temperature sublimation or solution-phase deposition onto a substrate.
进一步公开了优选通过相对低温升华或溶液相沉积到基底上来制造有机薄膜晶体管器件的方法。
With the increase of demand for thin film structures with specific phase properties, this white-light spectral interferometer can play an important role in future thin film industry.
随着对于薄膜位相调制特性要求的提高，该系统将可望在未来的薄膜工业中扮演比较重要的角色。
With the increase of demand for thin film structures with specific phase properties, this white-light spectral interferometer can play an important role in future thin film industry.
随着对于薄膜位相调制特性要求的提高，该系统将可望在未来的薄膜工业中扮演比较重要的角色。
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