Aiming at the problem of testing parametric fault in analog integrated circuits, an approach based on power spectrum correlation analysis for diagnosing parametric faults is presented.
针对模拟集成电路参数型故障的测试难题，提出了定位模拟集成电路参数型故障的功率谱相关分析方法。
Aiming at the problem of testing parametric fault in analog integrated circuits, an approach based on power spectrum correlation analysis for diagnosing parametric faults is presented.
针对模拟集成电路参数型故障的测试难题，提出了定位模拟集成电路参数型故障的功率谱相关分析方法。
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