He was on pins and needles, waiting for the test results.
他正等着考试的结果，感觉如坐针毡。
With the increasing of road test mileage, because of the fretting wear picking up, the combined firm degree of pins and outer link plate bore, bushings and inner link plate bore is declined gradually.
随着道路试验里程的增加，由于微动磨损的不断加剧，其销轴与外链板孔、套筒与内链板孔的联结牢固度在逐渐降低。
The problems existing in large shear clamp for shear test of pins are analyzed in detail in this paper, and practical improvement method is given.
对现有的剪断销剪切试验用重型单剪装置存在的问题进行了系统分析，提出了对该重型单剪装置结构优化的具体方案和实施办法。
The test results are instructive and of some referential values to the design, operation and maintenance of pins.
所得的试验结果对销轴设计、使用及维修具有一定的指导作用和参考价值。
By the experiment research on road running test of timing bushing chains for automotive engine, its wear mechanism and the worn surface of pins and bushings were analyzed.
通过道路试验研究，分析了汽车正时套筒链的磨损机制及销轴和套筒的磨损表面形貌。
In order to reduce the loss of the fault coverage when using the parity tree to compact the test response, a method of grouping compaction of the output pins is proposed in the paper.
为了减少利用奇偶树压缩测试响应时的故障覆盖损失，提出了一种输出端分组压缩的方法。
Attach test leads to pins 1 and 2 and note ohmmeter reading.
把测试探针连接到插头1和2，并记下欧姆表读数。
Attach test leads to pins 5 and 6 and note ohmmeter reading.
把测试探针连接到插头5和6，并记下欧姆表读数。
The digital logic chip of the invention and the method of design for testing can realize the observation of circuit scanning test by adopting few pins.
本发明的数字逻辑芯片及其可测试设计的方法，能够通过少量管脚实现电路在扫描测试时的可观测。
This design can test the connection of interface with many pins by using only a few GPIO and will be useful for LCM suppliers.
该测试方法使用较少的GPIO口就能实现对较多管脚的接口连通性的检测，具有一定的实用意义。
Processing time is further decreased by creating multiple scan chains and applying them to multiple pins of the device under test (DUT).
通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚，可以进一步减少处理时间。
My plan was to take the 2a03 off of the NES motherboard, and wire the FPGA directly to the pins it used. In this way, I could easily test and debug one component at a time.
我的计划是把2a03从任天堂主板上取下来，然后用引线把FPGA直接到上面，这样方便我一次只调试一个器件。
My plan was to take the 2a03 off of the NES motherboard, and wire the FPGA directly to the pins it used. In this way, I could easily test and debug one component at a time.
我的计划是把2a03从任天堂主板上取下来，然后用引线把FPGA直接到上面，这样方便我一次只调试一个器件。
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