The invention relates to the test field of integrated circuits and discloses a low power consumption test pattern generator of an integrated circuit and a test method thereof.
本发明涉及集成电路测试领域，公开了一种集成电路的低功耗测试图形生成器及其测试方法。
The invention relates to the test field of integrated circuits and discloses a low power consumption test pattern generator of an integrated circuit and a test method thereof.
本发明涉及集成电路测试领域，公开了一种集成电路的低功耗测试图形生成器及其测试方法。
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