Testing generation of un test faults is a major factor influencing the efficiency of sequential circuits testing generation.
对不可测故障进行测试产生是影响时序电路测试产生效率的一个重要因素。
Base on the existing synchronous sequential circuits fault simulator-HOPE, the test vector generation method of sequential circuits based on ant algorithm is systematically researched firstly.
本文在同步时序电路故障模拟器—HOPE的基础上，率先对基于蚂蚁算法的时序电路测试矢量生成方法作了系统的开拓性研究。
Base on the existing synchronous sequential circuits fault simulator-HOPE, the test vector generation method of sequential circuits based on ant algorithm is systematically researched firstly.
本文在同步时序电路故障模拟器—HOPE的基础上，率先对基于蚂蚁算法的时序电路测试矢量生成方法作了系统的开拓性研究。
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