• The Source-Measure Unit can also test other diode parameters, including forward voltage drop and breakdown voltage.

    源-测量单元还可以测量其它的二极管参数,包括正向电压降和击穿电压。

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  • In many test applications, the voltage and light output of the diode can be measured simultaneously using a fixed source current value.

    在很多测试应用中,二极管的电压和发出的光可以利用大小固定的电流源同时测出来。

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  • DUT is placed in test fixture such as diode, transistors, microstrip circuit and so on.

    被测件放在测试夹具里,如二极管、晶体管、微带电路等。

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  • To design and manufacture a constant-source with adjustable amplitude value and the test system, and to realize the examination of zener diode voltage drift parameter, is very important.

    设计制作出一个幅值可调的恒流源及其测试系统,实现稳压二极管电压漂移参数的检测,至关重要。

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  • The problems of laser diode life test are introduced, and the integrating cavity scanning (ICS) method is given in laser diodes (LD) high-temperature accelerating life test.

    介绍了半导体激光二极管(LD)寿命测试中存在的问题,并据此给出了LD高温加速寿命测试的积分球扫描法。

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  • This paper points out the problems existed in the experiment to test the characteristic curve of diode by voltammetry, and presents a method to improve the experiment.

    指出了一般用伏安法测二极管特性曲线一实验中存在的问题,同时给出其改进方法及在实验中应注意的问题。

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  • The results of test indicate that the reverse recovery softness of the diodes is increased to about 1.0, and is more improved than the conventional PIN diode.

    实验结果表明,该二极管的反向恢复软度因子提高到了1.0左右,较传统的PIN二极管有了较大改善。

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  • On the basis of accurate theory, using laser emitter and photosensitive diode as testing sensor, a set of laser equipment for automobile axle depth of parallelism test is designed and produced.

    利用激光发射器和光敏接收器作为检测传感器,基于准确的检测理论,设计出了激光检测法检测汽车前、后轴平行度的检测装置。

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  • After reconstruction can greatly improve the bugs above, to test SOD diode purpose.

    改造后能较大程度地改善以上缺陷,达到测试SOD二极管目的。

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  • The VF test is performed by sourcing a known current and measuring the resulting voltage drop across the diode.

    VF测试需要提供一个已知的电流然后测量二极管上产生的电压降。

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  • A method based on pulse injection was put forward to test the light-current-voltage (LIV) characteristics of laser diode (LD), and a new type of pulse measurement system was developed.

    为精确测试半导体激光器(LD)的光功率-电流-电压(LIV)特性,提出一种基于脉冲注入调制的方法,并据此研制新型的LD脉冲测试系统。

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  • We also fabricate multi-walled carbon nanotubes field emission cathodes, and test the field emission properties using diode structures.

    加外电场处理后,所制备的纳米碳管阴极场发射性能有一定提高。

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  • We also fabricate multi-walled carbon nanotubes field emission cathodes, and test the field emission properties using diode structures.

    加外电场处理后,所制备的纳米碳管阴极场发射性能有一定提高。

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