This circuit is the same as TEST CIRCUIT.
该电路是为测试电路相同。
The following is the schematic of a transient-response test circuit.
下面是瞬态相应测试电路的示意图。
Through the test circuit, the result shows that the design can be actually used.
通过对验证电路的测试，结果表明该设计可满足实际使用的要求。
The phase tracing simulation and the test circuit are made and the results are given.
最后进行了相位跟踪的计算机模拟和电路的实现，并给出了实验结果。
Test circuit, test method and results of race hazard circuit are presented in this paper.
本文给出竞争冒险的测试电路、测试方法和测试结果。
Use these calculated values of feedback capacitance as starting points for your test circuit.
利用这些反馈电容的计算值作为测试电路的出发点。
Experimentation indicates that this system can test circuit boards of locomotive control system.
经实验测试，证明该系统可以检测机车控制系统的各类板卡。
This paper introduces the structure principle and making method for a kind of assembly test circuit.
介绍了一种测试工装电路的结构原理及制作方法。
The test circuit, test equipment, calculating formula and test methods are introduced in this paper.
本文简要地介绍了点火线圈的点火能量测试线路、测试设备、计算公式和测试方法。
TMS320VC33 will be used to process data, and this paper put forwards test circuit associated with DSP.
采用TMS320VC33进行数据处理，给出了与DS P相连接的相关检测电路。
The invention provides a test circuit and a method for increasing the scanning coverage rate of a chip circuit.
本发明提供一种测试电路及其增加芯片电路扫描覆盖率的方法。
The RF pulse-to-pulse phase noise through microwave test circuit becomes a VF pulse signal of random fluctuation.
射频脉间相位噪声经过微波检测电路、视频电路后变成随机起伏的视频脉冲信号。
The core to design a synthetic test circuit is to correctly reproduce the stresses applied on the thyristor valves.
设计合成试验回路的核心在于，如何正确地再现作用在晶闸管阀上的负荷。
The simulation and experimental results verify that the test circuit with a radial stub is better than that without.
模拟和测试结果都表明，采用扇形线的测试电路性能较好。
Fourth, author designed test circuit board, signal transfer circuit board, 485 interface and USB HOST interface etc.
第四，设计了检测板、信号中转板、485接口和USBHOST接口等电路。
This paper presents a new structure of analog Built - in Self - Test circuit (ABIST) consisting of analog multiplexers.
本文提出了采用模拟多路开关的模拟内建自测试电路abist的一种新结构。
The system is composed of programmable power, test circuit, signal sampler, signal conditioner and data acquisition card.
系统由程控电源、测试回路、信号采样、调理电路和数据采集接口卡等部分组成。
The equipment has movable electrochemical probe, test circuit, notebook computer, power source circuit and test software.
设有可移动电化学探头、测试电路、笔记本电脑、电源电路及计算机软件。
Test circuit of AC servo system was composed of current test circuit, voltage test circuit, speed and position test circuit.
交流伺服系统检测电路由电流、电压、转速及位置检测电路组成。
The paper firstly presents the structure of IGCT test bench and its two cabinets for high-voltage producing and test circuit.
文章首先讲述了IGCT测试台的结构组成，分别设计了用于高压产生和高压测试的两个机柜。
The electromagnetic induction coil may be used for signal detecting of high capacity current test circuit and circuit breaker.
电磁感应线圈(茹可夫线圈)可用于大电流试验回路和断路器的信号检测。
The main test circuit adopts the auxiliary amplifier method with phase compensation circuits in order to avoid self-excitation.
运放参数主测试电路采用辅助放大器测试法设计，通过相位补偿网络消除电路自激现象。
Transient gamma irradiation experiment on "Qiangguang I" indicates that a latch-up window appears in the test circuit as predicated.
“强光i”瞬时伽马辐照实验显示，实验电路像预计的那样出现了闭锁窗口。
Nice equivalence of test circuit manifests in the initial part of recovery voltage and the physical process near current zero as well.
试验回路的等价性还表现在电流零点附近的物理过程和恢复电压的初始部分。
The invention discloses a test circuit for predicting static discharge failure of an integrated circuit and a prediction method thereof.
本发明公开了一种预报集成电路静电放电失效的测试电路及预测方法。
The analog part includes self-test circuit, charge amplifier, post-amplifier circuit, CDS and S/H circuit, integrator, unity gain buffer.
该电路的模拟部分包括电荷放大器、后级放大电器、相关双取样与采样保持电路、积分器、单位增益缓冲器。
The test circuit receives the second clock signal and the first clock signal outputted by the first IC chip to generate a comparable signal.
检测电路接收第二时钟讯号和第一集成电路芯片所输出的第一时钟讯号，以产生一比较讯号。
Hardware includes the test circuit, wireless transceiver and host computer communications; we also developed corresponding software programs.
硬件部分包括测试电路、无线收发和上位机通信，并编制了相应的软件程序。
This system is composed of a programmable power source, a test circuit, a signal sampler, a signal conditioner and a Single Chip Microcomputer.
测试系统包括程控电源、测试回路、信号采集、调理电路和单片机数据采集接口电路等部分。
This paper introduces a new type of test circuit for measuring the ar (?) gap dielectric recovery strength of low voltage electrical apparatus.
本文介绍一种测量低压电器弧隙介质恢复强度的试验线路。
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