A microprocessor based builtin test scheme for SOC is proposed, which employs transparency path test access mechanism.
提出了一种基于片上微处理器和透明路径测试访问的SO C自测试方案。
A microprocessor based builtin test scheme for SOC is proposed, which employs transparency path test access mechanism.
提出了一种基于片上微处理器和透明路径测试访问的SO C自测试方案。
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